Encyclopedia Nanotech -
A
B
C
D
E
F
G
H
I
L
M
N
O
P
Q
R
S
T
V
Scanning Force Microscopy (SFM)
Definition:
A type of scanning probe microscopy that maps the topography of an interface by scanning a force sensor over the interface.
See
Atomic Force Microscopy
Synonyms
Atomic Force Microscopy (AFM)
Related NanoWords
Scanning Probe Microscopy (SPM)
Scanning Tunneling Microscopy (STM)
Magnetic Force Microscopy (MFM)
Article Archives
Nanoword Link Directory
To subscribe to the free Nanoword Newsletter Write to
subscribe@nanoword.net
Author:
Steve Lenhert
About the Author
Copyright © 2001-2005 Quanteq, LLC. All rights reserved.
See 