| Definition: A type of scanning probe microscopy that maps the near-field optical properties of an interface.
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Known as SNOM in Europe and NSOM in North America, this technique takes advantage of the principle of optical tunneling. An optical probe which transfers or recieves electromagnetic energy from localized points above a 2D sample is required. The height of the probe over the surface can be determined by any of a number of feedback loops, the most common being shear-force. The exchange of light between the probe and surface is measured at each point and the resulting data provides a map of the near-field optical properties of the surface.
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Synonyms
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Nearfield Scanning Optical Microscopy (NSOM) |
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