Scanning Probe Microscopy

Scanning Probe Microscopy (SPM)

Definition: A method for imaging nanoscale features of surfaces by scanning a sensor (probe) over a surface. Near-field effects such as tunneling, van der Waals forces, local fields and more are serially detected at localized points on the surface and used to create an SPM image.

Related NanoWords

• Atomic Force Microscopy
• Scanning Tunneling Microscopy
• Scanning Near-field Optical Microscopy
• Magnetic Force Microscopy
• Scanning Capacitance Microscopy
• Scanning Thermal Microscopy

Used in Context

• Seeing Things Smaller Than Light
• Nanotech Image Gallery
• WS₂ Nanotubes

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Near-field effects such as tunneling, van der Waals forces, local fields and more are serially detected at localized points on the surface and used to create an SPM image.

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