Magnetic Force Microscopy (MFM)
Definition: A method for observing local magnetic fields near a surface by scanning the surface with a magnetic probe.
Related NanoWords
• Scanning Probe Microscopy
• Scanning Tunneling Microscopy
• Atomic Force Microscopy
• Scanning Near-field Optical Microscopy
• Scanning Capacitance Microscopy  

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MFM is sensitive to the magnetic properties of the surface in question. Like AFM, a sharp probe is attached to the bottom of a cantilever, which is scanned over the surface as a laser is bounced off of the top. In MFM, however, the probe must be magnetized in such a way that its interaction with various magnetic domains on the surface results in cantilever deflection. Such deflection is used to produce a data file or MFM image. Since much of our computer memory is stored on magnetic disks, this technology has a vast potential for microelectronic applications.

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